• DocumentCode
    568942
  • Title

    Structure and dielectric properties of Na1/2Bi1/2TiO3-BaTiO3 solid solutions

  • Author

    Dunce, M. ; Birks, E. ; Antonova, M. ; Plaude, A. ; Ignatans, R. ; Sternberg, A.

  • Author_Institution
    Dept. of Ferroelectrics, Univ. of Latvia, Riga, Latvia
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Dielectric properties, polarization and x-ray diffraction are studied for (1-x)Na1/2Bi1/2TiO3-xBaTiO3 solid solutions in a concentration range above the morphotropic phase boundary. It is showed that all the studied compositions have tetragonal structure with maximal tetragonality slightly above the morphotropic phase boundary. Ferroelectric relaxor behavior is observed in a wide concentration range of BaTiO3. Stability of the relaxor state decreases with increasing BaTiO3 concentration, but only for compositions with low Na1/2Bi1/2TiO3 content the normal ferroelectric-paraelectric phase transition, which is characteristic to pure BaTiO3, occurs. Mechanisms, which influence the change of the phase transition character and promote the appearance of the relaxor state, are discussed. The phase diagram of (1-x)Na1/2Bi1/2TiO3-xBaTiO3 is revised.
  • Keywords
    X-ray diffraction; barium compounds; bismuth compounds; dielectric polarisation; ferroelectric ceramics; ferroelectric transitions; permittivity; phase diagrams; relaxor ferroelectrics; sodium compounds; solid solutions; Na0.5Bi0.5TiO3-BaTiO3; dielectric polarization; ferroelectric relaxor behavior; ferroelectric-paraelectric phase transition; morphotropic phase boundary; phase diagram; solid solutions; structural properties; tetragonal structure; x-ray diffraction; Ceramics; Dielectrics; Lead; Permittivity; Solids; Temperature; Temperature measurement; NBT; NBT-BT; phase diagram; relaxor; solid solution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
  • Conference_Location
    Aveiro
  • Print_ISBN
    978-1-4673-2668-1
  • Type

    conf

  • DOI
    10.1109/ISAF.2012.6297754
  • Filename
    6297754