• DocumentCode
    568958
  • Title

    Polarity in nanoscale in PbZrxSn1−xO3 single crystals

  • Author

    Jankowska-Sumara, Irena ; Roleder, Krystian ; Szot, Krzysztof ; Majchrowski, Andrzej

  • Author_Institution
    Inst. of Phys., Pedagogical Univ., Krakow, Poland
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this work, the temperature dependencies of local piezo- and electrostrictive repsonse in single PZS crystals were measured by means of PEFM method and compared with a bulk responses. The local piezoelectric activity in the paraelectric phase measured in nanoscale, together with the observation of weak birefringence, are the direct proof for local lattice instability in wide temperature range (~50K) above Tc. Analysis of these features is a way to understand better the phase transition mechanisms in oxidic perovskites with antiferroelectric phase transition. In addition to expected non-homogeneous distribution of the Sn ions, discussed is important influence of the extended defects and other crystal inhomogeneities on the local electrostricitive and piezoelectric activities observed.
  • Keywords
    antiferroelectric materials; birefringence; crystal defects; electrostriction; ferroelectric transitions; lead compounds; nanostructured materials; piezoelectric materials; piezoelectricity; PEFM method; PbZrxSn1-xO3; Sn ions; antiferroelectric phase transition; bulk responses; crystal inhomogeneities; extended defects; local electrostricitive activities; local lattice instability; local piezoelectric activities; local piezoelectric activity; nanoscale single crystals; nonhomogeneous distribution; oxidic perovskites; paraelectric phase; phase transition mechanisms; polarity; single PZS crystals; temperature dependencies; weak birefringence; Cooling; Crystals; Heating; Temperature dependence; Temperature distribution; Temperature measurement; Tin; Piezoresponse Force Microscopy; antiferroelectricity; electrostriction; local properties; piezoelectricity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
  • Conference_Location
    Aveiro
  • Print_ISBN
    978-1-4673-2668-1
  • Type

    conf

  • DOI
    10.1109/ISAF.2012.6297794
  • Filename
    6297794