Title :
Polarity in nanoscale in PbZrxSn1−xO3 single crystals
Author :
Jankowska-Sumara, Irena ; Roleder, Krystian ; Szot, Krzysztof ; Majchrowski, Andrzej
Author_Institution :
Inst. of Phys., Pedagogical Univ., Krakow, Poland
Abstract :
In this work, the temperature dependencies of local piezo- and electrostrictive repsonse in single PZS crystals were measured by means of PEFM method and compared with a bulk responses. The local piezoelectric activity in the paraelectric phase measured in nanoscale, together with the observation of weak birefringence, are the direct proof for local lattice instability in wide temperature range (~50K) above Tc. Analysis of these features is a way to understand better the phase transition mechanisms in oxidic perovskites with antiferroelectric phase transition. In addition to expected non-homogeneous distribution of the Sn ions, discussed is important influence of the extended defects and other crystal inhomogeneities on the local electrostricitive and piezoelectric activities observed.
Keywords :
antiferroelectric materials; birefringence; crystal defects; electrostriction; ferroelectric transitions; lead compounds; nanostructured materials; piezoelectric materials; piezoelectricity; PEFM method; PbZrxSn1-xO3; Sn ions; antiferroelectric phase transition; bulk responses; crystal inhomogeneities; extended defects; local electrostricitive activities; local lattice instability; local piezoelectric activities; local piezoelectric activity; nanoscale single crystals; nonhomogeneous distribution; oxidic perovskites; paraelectric phase; phase transition mechanisms; polarity; single PZS crystals; temperature dependencies; weak birefringence; Cooling; Crystals; Heating; Temperature dependence; Temperature distribution; Temperature measurement; Tin; Piezoresponse Force Microscopy; antiferroelectricity; electrostriction; local properties; piezoelectricity;
Conference_Titel :
Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
Conference_Location :
Aveiro
Print_ISBN :
978-1-4673-2668-1
DOI :
10.1109/ISAF.2012.6297794