Measurement of independent piezoelectric constants of a Ca3TaGa3Si2O14 crystal by x-ray diffraction method

Author

Irzhak, D. ; Roshchupkin, D. ; Fahrtdinov, R.

Author_Institution

X-ray Acoustooptics Laboratoty, Inst. of Microelectron. Technol. & High-Purity Mater., Chernogolovka, Russia

fYear

2012

fDate

9-13 July 2012

Firstpage

1

Lastpage

4

Abstract

This work presents the results of independent piezoelectric constants measurements for calcium-tantalum gallosilicate (Ca₃TaGa₃Si₂O₁₄, CTGS) using double-crystal x-ray diffractometry. It is shown that one and the same sample can be used to measure all independent piezoconstants of the CTGS crystal. The measured values of the piezomoduli are d₁₁ = - 3.7098 · 10^-12 C N^-1 and d₁₄ = 24.29 · 10^-12 C N^-1. Under the conditions of the experiment the measurement error was 3%.

Keywords

X-ray diffraction; calcium compounds; crystal structure; gallium compounds; piezoelectric materials; piezoelectricity; tantalum compounds; Ca₃TaGa₃Si₂O₁₄; calcium-tantalum gallosilicate; double-crystal X-ray diffraction; independent piezoelectric constants; piezomoduli; Crystals; Electric fields; Geometry; Reflection; Tensile stress; X-ray diffraction; piezoelectric crystal; x-ray diffraction;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp

Conference_Location

Aveiro

Print_ISBN

978-1-4673-2668-1

Type

conf

DOI

10.1109/ISAF.2012.6297796

Filename

6297796