Title :
Fe valence determination in doped SrTiO3 epitaxial films
Author :
Kajewski, D. ; Szade, J. ; Kubacki, J. ; Szot, K. ; Köhl, A. ; Lenser, Ch ; Dittmann, R.
Author_Institution :
Inst. of Phys., Univ. of Silesia, Katowice, Poland
Abstract :
Atomic Force Microscopy (AFM) measurements have been performed for Fe doped SrTiO3 thin films with an Fe concentration of 2 and 5 at%. Thin films with a thickness of about 20 nm were grown by pulsed laser deposition on single crystalline SrTi0.99Nb0.01O3 substrates. Low-energy electron diffraction examination showed that the films are single crystalline. The regions treated with the AFM tip (applied dc voltage up to 6V) showed inhomogeneity of the electrical conductivity.
Keywords :
atomic force microscopy; doping; electrical conductivity; epitaxial layers; iron; low energy electron diffraction; pulsed laser deposition; strontium compounds; valence bands; AFM; SrTi0.99Nb0.01O3; SrTiO3:Fe; applied dc voltage; atomic force microscopy; electrical conductivity; iron doped strontium titanate thin films; iron valence determination; low energy electron diffraction; pulsed laser deposition; single crystalline strontium titanium niobates substrate; strontium titanate epitaxial films; Conductivity; Crystals; Films; Iron; Switches; Temperature measurement; LC-AFM; SrTiO3; XAS; resonant photoemision;
Conference_Titel :
Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
Conference_Location :
Aveiro
Print_ISBN :
978-1-4673-2668-1
DOI :
10.1109/ISAF.2012.6297843
