• DocumentCode
    570437
  • Title

    Area Spare Power Automatic Switchover test system based on digital simulation

  • Author

    Yilin, Zhou ; Sun Jianwei ; Jiongcong, Chen ; Fei, Liu

  • Author_Institution
    Power Grid Autom. Key Lab. of China South Grid, Electr. Power Res. Inst. of Guangdong Power Grid Corp., Guangzhou, China
  • fYear
    2012
  • fDate
    21-24 May 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    With the development of power grid, traditional Spare Power Automatic Switchover became far from satisfaction of the grid operation. Area Spare Power Automatic Switchover(ASPAS) System, supported by automation, communications and internet technology, must go through rigorous testing before the closed-loop operation. The digital simulation technology of ASPAS test system acquires actual network collusion model by simulation, intend to analog the power-grid-operation. The SCADA collect measure data , send to the ASPAS module; the ASPAS module produce a strategy, send a switch control command to the SCADA, and renew the network operation status, creating a real-time closed-loop test environment. Test system compares the test and actual action process of ASPAS system by two ways-detecting the fault conditions of network or sending the SCADA simulation data into actual ASPAS system, providing a basis of the actual ASPAS operation.
  • Keywords
    SCADA systems; smart power grids; switchgear; ASPAS test system; SCADA; actual network collusion model; area spare power automatic switchover test system; closed-loop operation; digital simulation technology; network operation status; power grid; real-time closed-loop test environment; rigorous testing; switch control; Data models; Load modeling; Power system dynamics; Protective relaying; Substations; Switches; Area Spare Power Automatic Switchover; Digital simulation; Flow calculation; Smart grid; Test system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Innovative Smart Grid Technologies - Asia (ISGT Asia), 2012 IEEE
  • Conference_Location
    Tianjin
  • Print_ISBN
    978-1-4673-1221-9
  • Type

    conf

  • DOI
    10.1109/ISGT-Asia.2012.6303263
  • Filename
    6303263