Title :
Study on structural vulnerabilities of power grids based on the electrical distance
Author :
Wang, Yansong ; Zhao, Jinli ; Zhang, Fei ; Lei, Binghui
Author_Institution :
Dept. of Electr. Eng., Tianjin Univ., Tianjin, China
Abstract :
To ensure reliable and secure operation of today´s large scale interconnected power systems, one of the most basic parts is to have a reasonable transmission infrastructure. Currently, the applications of complex networks theory on power grids are mostly based on the topological structure, while it fails to capture the electrical characteristics of power systems. In this paper, a grid modeling method is proposed which can be used to establish the graph models of power grids based on the concept of electrical distance. Then with the complex network theory, some statistical properties of these models could be analyzed, and the parameters such as Degree, Degree Distribution, Hub nodes and Clustering properties which play key roles in the evaluation of network structure can be studied and compared with the results based on the topological structure of IEEE-118-bus and IEEE-300-bus test systems. Finally the spectral clustering method is applied for partitioning of power grid and locating vulnerable interfaces.
Keywords :
IEEE standards; graph theory; pattern clustering; power grids; power system interconnection; power system security; power transmission reliability; statistical analysis; IEEE-118-bus test systems; IEEE-300-bus test systems; clustering properties; complex network theory; degree distribution; electrical distance concept; graph models; grid modeling method; hub nodes; large scale interconnected power systems; power grid structural vulnerabilities; spectral clustering method; statistical properties; transmission infrastructure; Complex networks; Impedance; Power grids; Power system faults; Power system stability; Topology; complex network; electrical distance; mutual impedance; power grids; spectral partition; vulnerability;
Conference_Titel :
Innovative Smart Grid Technologies - Asia (ISGT Asia), 2012 IEEE
Conference_Location :
Tianjin
Print_ISBN :
978-1-4673-1221-9
DOI :
10.1109/ISGT-Asia.2012.6303284