Title :
Application research base on system engineering for analyzing smart grid standards
Author :
Tan, Wen ; Bair, Xiaomin
Author_Institution :
China Electr. Power Res. Inst., Beijing, China
Abstract :
This paper introduces a new tool for analyze Smart Grid standards, IEC mapping chart. Using it will for the first time allow standard users to connect the subtleties of all relevant standards and identify overlaps and gaps. Result show significant improvement over previous efforts. The work presented here has profound implications for future studies of Smart Grid deployment and may finally solve the problem of organization and prioritization to achieve an interoperable and secure Smart Grid.
Keywords :
IEC standards; power system security; smart power grids; systems engineering; IEC mapping chart; application research; interoperable smart grid; organization problem; prioritization problem; secure smart grid; smart grid deployment; smart grid standards analysis; system engineering; IEC standards; Smart grids; Substations; Systems engineering and theory; IEC standards; Smart grids;
Conference_Titel :
Innovative Smart Grid Technologies - Asia (ISGT Asia), 2012 IEEE
Conference_Location :
Tianjin
Print_ISBN :
978-1-4673-1221-9
DOI :
10.1109/ISGT-Asia.2012.6303370