DocumentCode :
571042
Title :
Resistive and ion-focused electron beam transport in capillaries
Author :
Hubbard, R.F. ; Fernsler, R.F. ; Slinker, S.P. ; Lampe, M. ; Fisher, Amnon ; Tang, C.M. ; Myers, Matthew C.
Author_Institution :
Plasma Physics Division, Naval Research Laboratory, Washington, DC 20375-5346, USA
Volume :
2
fYear :
1994
fDate :
20-24 June 1994
Firstpage :
656
Lastpage :
659
Abstract :
Pinched propagation of intense, pulsed electron beams occurs in two gas pressure regimes: a high pressure resistive regime and the low pressure ion focused regime (IFR). Although in most experiments, the transport tube radius aw is large compared with the beam radius ab´ beams can be efficiently transported in either regime even when aw/ab ≲ 3. Return currents in the tube wall provide a centering force which reduces the growth of transverse instabilities such as resistive hose or ion hose while correcting for minor aiming errors. The use of pinched transport eliminates the need for guide magnets. Analytical and simulation results show that it may be possible to transport high brightness, moderate power beams with ab ≪ 1 cm in narrow tubes or capillaries over distances of tens or hundreds of centimeters.
fLanguage :
English
Publisher :
iet
Conference_Titel :
High-Power Particle Beams, 1994 10th International Conference on
Conference_Location :
San Diego, CA, USA
Print_ISBN :
978-1-4244-1518-2
Type :
conf
Filename :
6304539
Link To Document :
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