DocumentCode
571158
Title
SiC JFET integrated circuits for sensing and control at temperatures up to 600°C
Author
Garverick, Steven L. ; Soong, Chia-Wei ; Mehregany, Mehran
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Case Western Reserve Univ., Cleveland, OH, USA
fYear
2012
fDate
29-31 May 2012
Firstpage
1
Lastpage
6
Abstract
N-channel JFET integrated circuits were fabricated in 6H silicon carbide, a wide-bandgap semiconductor capable of operation at extremely high temperatures, to support applications in high-temperature sensing and control commonly found in systems that consume or generate large quantities of energy. The JFETs were successfully modeled, and hybrid amplifiers were constructed using SiC differential pairs and silicon active/passive components to provide a high-temperature sensor interface circuit requiring minimal SiC integration. Fully integrated, differential amplifiers were designed, fabricated, and tested. A two-stage amplifier with current-source loads and common-mode feedback in the 1st-stage, has a voltage gain of 69 dB at 576°C, with just 3.6 dB gain-variation from 25 to 576°C. High-performance, integrated logic circuits were also developed. The inverter has excellent dc characteristics with a gain >; -20 up to 500°C. NAND/NOR logic circuits were tested dynamically and perform well at temperatures up to 550°C.
Keywords
NAND circuits; NOR circuits; differential amplifiers; invertors; junction gate field effect transistors; sensors; silicon compounds; wide band gap semiconductors; 6H silicon carbide; N-channel JFET integrated circuit; NAND logic circuit; NOR logic circuit; SiC; SiC JFET integrated circuit; common-mode feedback; current-source load; differential amplifier; differential pair; gain 3.6 dB; gain 69 dB; high-temperature sensing; high-temperature sensor interface circuit; hybrid amplifier; integrated amplifier; integrated logic circuit; inverter; silicon active-passive component; temperature 0 C to 576 C; two-stage amplifier; wide-bandgap semiconductor; Gain; Integrated circuit modeling; JFETs; Logic gates; Silicon carbide; Temperature measurement; Voltage measurement; device model; differential amplifier; high-temperature electronics; integrated circuit; junction field effect transistor; logic circuit; sensor interface; silicon carbide;
fLanguage
English
Publisher
ieee
Conference_Titel
Energytech, 2012 IEEE
Conference_Location
Cleveland, OH
Print_ISBN
978-1-4673-1836-5
Electronic_ISBN
978-1-4673-1834-1
Type
conf
DOI
10.1109/EnergyTech.2012.6304660
Filename
6304660
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