• DocumentCode
    572109
  • Title

    A new time-resolved energy-flux gauge for pulsed ion beams

  • Author

    Richter, Steven H. ; Keller, Donald V.

  • Author_Institution
    Ktech Corp., Albuquerque, NM, USA
  • Volume
    2
  • fYear
    1992
  • fDate
    25-29 May 1992
  • Firstpage
    1391
  • Lastpage
    1396
  • Abstract
    A new time-resolved energy-flux (TREF) gauge has been developed and tested for direct flux measurement of charge- and current-neutralized light-ion beams. This diagnostic technique is effective for any rapid energy deposition where the following conditions are met: (a) the time for stress release wave transit across the deposition region is much less than the deposition time, (b) the energy deposition depth is approximately flat over the penetration depth and constant in time, (c) the Gruneisen parameter is independent of energy or the energy dependence is known, and (d) the material behaves elastically. TREF gauge fluence measurements of 1-MeV proton beams agree well with simultaneous fluence calorimeter measurements. The gauge may be useful for diagnosing other pulsed energy deposition sources where the deposition region is shallow with respect to the deposition time.
  • Keywords
    Aluminum; Equations; History; Ion beams; Materials; Mathematical model; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Power Particle Beams, 1992 9th International Conference on
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    000-0-0000-0000-0
  • Type

    conf

  • Filename
    6306672