DocumentCode :
57255
Title :
Refractive Index Measurement With High Precision by a Laser Diode Self-Mixing Interferometer
Author :
Chenxi Chen ; Yongbing Zhang ; Xiulin Wang ; Xiaozhong Wang ; Wencai Huang
Author_Institution :
Dept. of Electron. Eng., Xiamen Univ., Xiamen, China
Volume :
7
Issue :
3
fYear :
2015
fDate :
Jun-15
Firstpage :
1
Lastpage :
6
Abstract :
A new method based on the laser diode self-mixing interference effect for refractive index measurement is demonstrated. It employs a simple translation method to measure the optical phase shift as a function of the moving distance of the sample. The refractive index is determined by analyzing a fringe number of self-mixing signals with respect to the moving distance and the incidence angle, with an experimental accuracy of 0.004. Interestingly, the setting error of the proposed system can be effectively decreased by modifying the incidence angle. This method also shows the advantage of a large measurable range of the refractive index.
Keywords :
light interference; light interferometers; measurement by laser beam; refractive index measurement; semiconductor lasers; fringe number; incidence angle; laser diode self-mixing interferometer; moving distance; optical phase shift; refractive index measurement; self-mixing interference; setting error; translation method; Interference; Optical feedback; Optical interferometry; Optical reflection; Optical refraction; Optical variables control; Refractive index; Refractive index; Self-mixing interference (SMI); refractive index;
fLanguage :
English
Journal_Title :
Photonics Journal, IEEE
Publisher :
ieee
ISSN :
1943-0655
Type :
jour
DOI :
10.1109/JPHOT.2015.2431256
Filename :
7104064
Link To Document :
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