DocumentCode :
572659
Title :
Soft X-ray spectroscopic investigation of a plasma focus operated in pure neon
Author :
Presura, R. ; Zoita, Y. ; Paraschiv, Ion
Author_Institution :
Institute of Physics and Technology of Radiation Devices, Plasma Physics and Nuclear Fusion Laboratory, P.O. Box 5206, Magurele, R-76900, Bucharest, ROMANIA
Volume :
1
fYear :
1996
fDate :
10-14 June 1996
Firstpage :
595
Lastpage :
598
Abstract :
The soft X-ray emission of the medium-energy plasma focus device IPF-2/20 operated in pure neon was studied with spectral resolution. The spectra of H- and He-like Ne ions were recorded by means of a de Broglie spectrograph for initial filling pressures in the range 1.3 ÷ 7 torr. Both the soft X-ray emission characteristics and the plasma parameters are strongly dependent on the working gas pressure. The intensity of the He-like neon ions lines increases when the working gas pressure is raised, while for the H-like ions it has a maximum for about 5 torr filling. The electron density has values of the order of 1020 cm−3. The electron temperature ranges between 300 and 350 eV. Both the plasma density and the plasma temperature decrease when the initial gas pressure is increased.
fLanguage :
English
Publisher :
iet
Conference_Titel :
High-Power Particle Beams, 1996 11th International Conference on
Conference_Location :
Prague, Czech Republic
Print_ISBN :
978-80-902250-3-9
Type :
conf
Filename :
6308395
Link To Document :
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