• DocumentCode
    572659
  • Title

    Soft X-ray spectroscopic investigation of a plasma focus operated in pure neon

  • Author

    Presura, R. ; Zoita, Y. ; Paraschiv, Ion

  • Author_Institution
    Institute of Physics and Technology of Radiation Devices, Plasma Physics and Nuclear Fusion Laboratory, P.O. Box 5206, Magurele, R-76900, Bucharest, ROMANIA
  • Volume
    1
  • fYear
    1996
  • fDate
    10-14 June 1996
  • Firstpage
    595
  • Lastpage
    598
  • Abstract
    The soft X-ray emission of the medium-energy plasma focus device IPF-2/20 operated in pure neon was studied with spectral resolution. The spectra of H- and He-like Ne ions were recorded by means of a de Broglie spectrograph for initial filling pressures in the range 1.3 ÷ 7 torr. Both the soft X-ray emission characteristics and the plasma parameters are strongly dependent on the working gas pressure. The intensity of the He-like neon ions lines increases when the working gas pressure is raised, while for the H-like ions it has a maximum for about 5 torr filling. The electron density has values of the order of 1020 cm−3. The electron temperature ranges between 300 and 350 eV. Both the plasma density and the plasma temperature decrease when the initial gas pressure is increased.
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    High-Power Particle Beams, 1996 11th International Conference on
  • Conference_Location
    Prague, Czech Republic
  • Print_ISBN
    978-80-902250-3-9
  • Type

    conf

  • Filename
    6308395