Working gas effects on the X-ray emission of a plasma focus device

Experiments on the plasma focus device IPF-2120 operating with argon,neon and mixtures of argon with deuterium were performed and some X-ray emission parameters measured. The time evolution of the X-ray emission and dependence of the X-ray yield on the working gas composition was analyzed. The softer X radiation was measured with time resolution in the energy bands from 4 to 40 keV, and the hard X-rays for energies above 200 keV. In deuterium-argon mixtures the soft X-ray yield increases both with pressure (for the same ratio of argon) and with the quantity of argon added to deuterium at the same total pressure. For argon or neon the hard X-ray yield is lower than for deuterium-heavy gas mixtures. The softer X-ray yield decreases with pressure both for neon and for argon.