• DocumentCode
    572787
  • Title

    Investigation of the composition of an ion beam produced using a multi arc ion source

  • Author

    Engelko, Vladimir ; Giese, Holger ; Mischin, M. ; Schalk, Stefan ; Tsibin, O.Y.

  • Author_Institution
    Efremov Institute of Electro physical Apparatus, 189631, St. Petersburg, Russia
  • Volume
    2
  • fYear
    1996
  • fDate
    10-14 June 1996
  • Firstpage
    1107
  • Lastpage
    1110
  • Abstract
    Complementing the diode and beam transport optimization studies currently performed in FZK/Karlsruhe on the proton-beam-facility PROFA [1,2], side investigations were run at the St. Petersburg State University which focused on ion beam divergence and composition measurements using TOF techniques. To ensure direct transferability of the results to the PROFA facility, these measurements were made on a scaled down replica of the PROF A diode, comprising an array of small polyethylene flash-over plasma sources and a grid extraction system. Presented here are only the results of the beam composition measurements, which allow the following conclusions: (i) The ion beam contains H and C ions and heavier constituents that still have to be identified. (ii) The beam composition changes significantly with the total number of shots: While in the start phase of the experiments H+ ions predominated, heavier components outweighed these later on in the experiments, supposedly due to hydrogen depletion of the surface layer of the anode polyethylene units. (iii) Reconditioning of the polyethylene units seems possible by running the diode at higher currents (self cleaning) or by cutting off a surface layer.
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    High-Power Particle Beams, 1996 11th International Conference on
  • Conference_Location
    Prague, Czech Republic
  • Print_ISBN
    978-80-902250-3-9
  • Type

    conf

  • Filename
    6308534