DocumentCode :
572792
Title :
Ion diode diagnostics to resolve beam quality issues
Author :
Bluhm, H. ; Arzhannikov, A. ; Buth, L. ; Hoppe, P. ; Licht, V. ; Matveenko, A. ; Rusch, D. ; Stoltz, O. ; Singer, J. ; Singleton, Colin ; Tauschwitz, A. ; Vath, W. ; Yoo, Sang-Im
Author_Institution :
Forschungszentrum Karlsruhe, Institut für Neutronenphysik und Reaktortechnik, Postfach 3640, 76021, Germany
Volume :
2
fYear :
1996
fDate :
10-14 June 1996
Firstpage :
1127
Lastpage :
1130
Abstract :
Various diagnostic methods and instruments are under development at FZK to measure important physical quantities in the accelerating gap of high power ion diodes on KALIF with high spatial and temporal resolution. These methods include optical spectroscopy, refractive index measurements, dispersion interferometry, and high resolution ion energy analysis. The paper describes the set-up of these diagnostics and first results obtained for applied arid selfrnagnetically insulated diodes.
fLanguage :
English
Publisher :
iet
Conference_Titel :
High-Power Particle Beams, 1996 11th International Conference on
Conference_Location :
Prague, Czech Republic
Print_ISBN :
978-80-902250-3-9
Type :
conf
Filename :
6308539
Link To Document :
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