Title :
Single Event Effects in Carbon Nanotube-Based Field Effect Transistors Under Energetic Particle Radiation
Author :
Bushmaker, Adam W. ; Walker, David ; Mann, Colin J. ; Oklejas, Vanessa ; Hopkins, Alan R. ; Amer, Moh R. ; Cronin, Stephen B.
Author_Institution :
Phys. Sci. Labs., Aerosp. Corp., El Segundo, CA, USA
Abstract :
We present results from proton radiation experiments with carbon nanotube field effect transistors. Single event effects were observed consisting of drops in current, with very long durations (100 s of ms), and sudden, discrete switching events between quantized current levels. These studies are important for the development and understanding of advanced nano-electronic devices operating in the space radiation environment.
Keywords :
carbon nanotube field effect transistors; proton effects; radiation hardening (electronics); carbon nanotube field effect transistors; discrete switching events; energetic particle radiation; proton radiation experiments; quantized current levels; single event effects; space radiation environment; Carbon nanotubes; Field effect transistors; Logic gates; Proton radiation effects; Radiation effects; Carbon nanotube; field effect transistor (FET); proton radiation; single event effects (SEEs);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2014.2367519
