DocumentCode :
57316
Title :
Evaluation of Submillimeter/Terahertz Camera Performance With the Cryogenic Multi-Channel Read Out System
Author :
Hibi, Y. ; Matsuo, Hiroshi ; Sekiguchi, Shigeyuki ; Ikeda, Hinata ; Fujiwara, Masamichi
Author_Institution :
Nat. Astron. Obs. of Japan, Mitaka, Japan
Volume :
3
Issue :
4
fYear :
2013
fDate :
Jul-13
Firstpage :
422
Lastpage :
427
Abstract :
The purpose of our development is to realize the terahertz camera with superconducting tunnel junction detectors and cryogenic integrated circuits made of gallium-arsenide junction field-effect transistors (GaAs-JFET). This paper presents the first demonstration of such system. First, we have combined cryogenic charge integrating amplifiers made of GaAs-JFETs with the superconductor-insulator-superconductor (SIS) photon detectors at 0.5 K, and the detector current was successfully read out by the cryogenic amplifiers. Secondly, we have demonstrated an operation of a 32-channel multi-chip module all made of the GaAs-JFET circuits. The module has 32-channel detector input ports and two read out multiplexers for fast sampling. The power dissipation is about 350 μW . Using 910 kΩ resistors in place of detectors we measured output voltage noise of 3 mVrms with a charge integration time of 1 ms,. From these results, we have proven the terahertz camera technologies using SIS photon detectors and cryogenic read out electronics with the noise equivalent power (NEP) of 3.8 × 10-15 W/Hz0.5 and 1 kHz frame rate.
Keywords :
III-V semiconductors; cameras; cryogenic electronics; detector circuits; gallium arsenide; junction gate field effect transistors; multiplexing equipment; performance evaluation; readout electronics; submillimetre wave amplifiers; submillimetre wave detectors; submillimetre wave imaging; submillimetre wave integrated circuits; superconducting integrated circuits; superconductive tunnelling; superconductor-insulator-superconductor devices; terahertz wave detectors; terahertz wave imaging; 32-channel multichip module; GaAs; JFET; NEP; SIS; cryogenic charge integrating amplifier; cryogenic integrated circuit; cryogenic multichannel readout system; frequency 1 kHz; junction field-effect transistor; noise equivalent power; output voltage noise measurement; power dissipation; read out multiplexer; readout detector current; resistance 910 kohm; resistor; submillimeter-terahertz camera performance evaluation; superconducting tunnel junction detector; superconductor-insulator-superconductor photon detector; temperature 0.5 K; time 1 ms; voltage 3 mV; Application specific integrated circuits (ASICs); cryogenic electronics; gallium–arsenide JFETs (GaAs-JFETs); imaging sensors; multichip modules; superconducting tunnel junction detectors;
fLanguage :
English
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-342X
Type :
jour
DOI :
10.1109/TTHZ.2013.2258714
Filename :
6515335
Link To Document :
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