Double-Tip Diffraction Modeling: 2-D Numerical Models versus High-Frequency Asymptotics

Author

Ozgun, Ozlem ; Sevgi, Levent

Author_Institution

Dept. of Electr. & Electron. Eng., Hacettepe Univ., Ankara, Turkey

Volume

63

Issue

6

fYear

2015

fDate

Jun-15

Firstpage

2686

Lastpage

2693

Abstract

The subject of single and double diffraction phenomena has long been investigated by high-frequency asymptotic techniques. However, integral or differential equation-based numerical methods suffer from computational complexity due to electrically large geometries encountered in high-frequency problems. The main purpose of this paper is to present the finite element (FEM) diffraction modeling of double-tip structure and to compare its results with high-frequency methods and other numerical models. FEM is made feasible for modeling of such an infinitely long structure by utilizing the locally conformal perfectly matched layer (PML) approach, which enables the use of finite-sized structure. MATLAB codes are developed and various numerical examples are demonstrated in a comparative manner.

Keywords

computational complexity; finite element analysis; geometrical theory of diffraction; physical theory of diffraction; 2D numerical models; FEM diffraction modeling; MATLAB codes; PML; computational complexity; double-tip diffraction modeling; finite element diffraction modeling; finite-sized structure; high-frequency asymptotic techniques; locally conformal perfectly matched layer approach; physical theory-of-diffraction; single diffraction phenomena; uniform theory-of-diffraction; Boundary conditions; Computational modeling; Diffraction; Finite element analysis; Geometry; Mathematical model; Numerical models; Diffraction; double diffraction; double tips; finite element method (FEM); high frequency asymptotics; high-frequency asymptotics (HFAs); locally conformal PML; locally-conformal PML; physical theory of diffraction (PTD); uniform theory of diffraction (UTD);

fLanguage

English

Journal_Title

Antennas and Propagation, IEEE Transactions on

Publisher

ieee

ISSN

0018-926X

Type

jour

DOI

10.1109/TAP.2015.2417583

Filename

7072461