• DocumentCode
    57358
  • Title

    EReLA: A Low-Power Reliable Coarse-Grained Reconfigurable Architecture Processor and Its Irradiation Tests

  • Author

    Yao, JingTao ; Saito, Masato ; Okada, Shogo ; Kobayashi, Kaoru ; Nakashima, Yuta

  • Author_Institution
    Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Ikoma, Japan
  • Volume
    61
  • Issue
    6
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    3250
  • Lastpage
    3257
  • Abstract
    In this work, facing pressure from both the increasing vulnerability to single event effects (SEEs) and design constraints of the power consumption, we have proposed a Coarse-Grained Reconfigurable Architecture (CGRA) processor. Our goal is to translate a user programmable redundancy to a guide for balancing energy consumption on the one hand and the reliability requirements on the other. We designed software (SW) and hardware (HW) approaches, coordinating them closely to achieve this purpose. The framework provides several user-assignable patterns of redundancy and the hardware modules to interpret well these patterns. A first version prototype processor, with the name EReLA (Explicit Redundancy Linear Array) has been implemented and manufactured with a 0.18 μm CMOS technology. Stress tests based on alpha particle irradiation were conducted to verify the tradeoff between the robustness and the power efficiency of the proposed schemes.
  • Keywords
    CMOS integrated circuits; low-power electronics; microprocessor chips; radiation hardening (electronics); reconfigurable architectures; reliability; CMOS technology; EReLA; alpha particle irradiation; explicit redundancy linear array; irradiation tests; low power reliable coarse grained reconfigurable architecture processor; power consumption; single event effects; size 0.18 mum; stress tests; user programmable redundancy; Data flow computing; Fault tolerance; Radiation effects; Reconfigurable architectures; Redundancy; VLIW; Data flow computing; fault tolerance; reconfigurable architectures; redundancy;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2014.2367541
  • Filename
    6966813