Title :
SEU sensitivity of robust communication protocols
Author :
Lopez-Ongil, C. ; Portela-Garcia, M. ; Garcia-Valderas, M. ; Vaskova, A. ; Entrena, L. ; Rivas-Ábalo, J. ; Martín-Ortega, A. ; Martinez-Oter, J. ; Rodríguez-Bustabad, S. ; Arruego, I.
Author_Institution :
Electron. Technol. Dept., Univ. Carlos III of Madrid, Leganes, Spain
Abstract :
Robust communications protocols are widely used in safety critical applications, such as aerospace or automotive systems. On-board complex systems, working in harsh environments, are composed of distributed modules with a high degree of interaction and critical tasks replication. Single Event Upsets (SEUs) are very probable to affect these modules and their communications. Robust protocols are usually designed to correct communication data errors, usually due to problems in the physical medium (e.g. noise). They provide robustness in data transmission but fault tolerance is not ensured in the interface control logic. In this work, a study of the SEU sensitivity of a typical robust communication protocol, the CAN bus, is performed. Authors have applied an extensive fault injection campaign in the internal modules of the circuit that implements this standard in order to perform a depth analysis. Experimental results prove robustness is not complete in the control part of this protocol. Selective hardening will enhance this robustness with low extra cost in terms of area or performance.
Keywords :
controller area networks; data communication; fault tolerance; field buses; protocols; CAN bus; SEU sensitivity; communication data errors; data transmission; distributed modules; fault tolerance; interface control logic; on-board complex system; physical medium; robust communication protocols; safety critical applications; single event upset; Aerospace electronics; Circuit faults; Fault tolerance; Fault tolerant systems; Flip-flops; Protocols; Robustness; CAN Bus; On-board Distributed Systems; SEUs; Transient Fault Emulation;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International
Conference_Location :
Sitges
Print_ISBN :
978-1-4673-2082-5
DOI :
10.1109/IOLTS.2012.6313870