• DocumentCode
    574101
  • Title

    Next-generation wafer stage motion control: Connecting system identification and robust control

  • Author

    Oomen, Tom ; van Herpen, Robbert ; Quist, S. ; van de Wal, Marc ; Bosgra, Okko ; Steinbuch, Maarten

  • Author_Institution
    Eindhoven Univ. of Technol., Eindhoven, Netherlands
  • fYear
    2012
  • fDate
    27-29 June 2012
  • Firstpage
    2455
  • Lastpage
    2460
  • Abstract
    Next-generation precision motion systems are lightweight to meet stringent requirements regarding throughput and accuracy. Such lightweight systems typically exhibit lightly damped flexible dynamics in the controller cross-over region. State-of-the-art modeling and motion control design procedures do not deliver the required model fidelity to control the flexible dynamical behavior. In this paper, identification and control challenges are investigated and a novel approach for next-generation motion control is presented. The procedure is applied to a multivariable wafer stage, confirming a significant performance improvement.
  • Keywords
    identification; integrated circuit manufacture; mass production; motion control; multivariable control systems; process control; robust control; semiconductor technology; controller cross-over region; integrated circuits; lightly damped flexible dynamics; mass production; multivariable wafer stage; next-generation precision motion systems; next-generation wafer stage motion control; robust control; system identification; Computational modeling; Motion control; Next generation networking; Robust control; Robustness; Semiconductor device modeling; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2012
  • Conference_Location
    Montreal, QC
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4577-1095-7
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2012.6314685
  • Filename
    6314685