DocumentCode
574101
Title
Next-generation wafer stage motion control: Connecting system identification and robust control
Author
Oomen, Tom ; van Herpen, Robbert ; Quist, S. ; van de Wal, Marc ; Bosgra, Okko ; Steinbuch, Maarten
Author_Institution
Eindhoven Univ. of Technol., Eindhoven, Netherlands
fYear
2012
fDate
27-29 June 2012
Firstpage
2455
Lastpage
2460
Abstract
Next-generation precision motion systems are lightweight to meet stringent requirements regarding throughput and accuracy. Such lightweight systems typically exhibit lightly damped flexible dynamics in the controller cross-over region. State-of-the-art modeling and motion control design procedures do not deliver the required model fidelity to control the flexible dynamical behavior. In this paper, identification and control challenges are investigated and a novel approach for next-generation motion control is presented. The procedure is applied to a multivariable wafer stage, confirming a significant performance improvement.
Keywords
identification; integrated circuit manufacture; mass production; motion control; multivariable control systems; process control; robust control; semiconductor technology; controller cross-over region; integrated circuits; lightly damped flexible dynamics; mass production; multivariable wafer stage; next-generation precision motion systems; next-generation wafer stage motion control; robust control; system identification; Computational modeling; Motion control; Next generation networking; Robust control; Robustness; Semiconductor device modeling; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2012
Conference_Location
Montreal, QC
ISSN
0743-1619
Print_ISBN
978-1-4577-1095-7
Electronic_ISBN
0743-1619
Type
conf
DOI
10.1109/ACC.2012.6314685
Filename
6314685
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