• DocumentCode
    574243
  • Title

    Thermal models characterization for reliable temperature capping and performance optimization in Multiprocessor Systems on Chip

  • Author

    Tilli, Andrea ; Garone, E. ; Cacciari, Matteo ; Bartolini, Andrea

  • Author_Institution
    Dept. of Electron., Comput. Eng. & Syst. (DEIS), Univ. of Bologna, Bologna, Italy
  • fYear
    2012
  • fDate
    27-29 June 2012
  • Firstpage
    4721
  • Lastpage
    4726
  • Abstract
    Modern Multiprocessor Systems-on-Chip (MP-SoC) offer high computing performance at the expense of huge power densities unevenly distributed on the chip. This generates hot spots that may cause performance and reliability degradations as well as power consumption increases. In recent years several thermal control strategies have been developed to avoid the occurrences of these hot spots. In particular, schemes based on Model Predictive Control (MPC) theory represent the actual state-of-the-art due to their capability to explicitly deal with constraints. In this paper we discuss some important properties for the design of predictive controllers with constraints for the class of thermal system. Starting from the general partial differential equation representing the heat diffusion in a solid, the feasibility and a useful property for the reduction of the number of constraints are proven. Moreover, exploiting theoretical results, a two layers control architecture is presented, which is capable of ensuring feasibility in every circumstance. Simulative results show the benefits of this approach.
  • Keywords
    integrated circuit reliability; multiprocessing systems; partial differential equations; performance evaluation; power aware computing; predictive control; system-on-chip; temperature control; MP-SoC; MPC; control architecture; general partial differential equation; hot spot generation; model predictive control theory; multiprocessor systems-on-chip; performance degradations; performance optimization; power consumption; power densities; reliability degradations; reliable temperature capping; thermal control strategies; thermal models characterization; thermal system; Computational modeling; Heating; Mathematical model; Predictive models; Safety; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2012
  • Conference_Location
    Montreal, QC
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4577-1095-7
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2012.6314827
  • Filename
    6314827