Title :
Modeling and Investigations on TID-ASETs Synergistic Effect in LM124 Operational Amplifier From Three Different Manufacturers
Author :
Roig, Fabien ; Dusseau, L. ; Khachatrian, Ani ; Roche, Nicholas J.-H ; Privat, A. ; Vaille, J.-R. ; Boch, J. ; Warner, Jeffrey H. ; Saigne, F. ; Buchner, Stephen P. ; McMorrow, Dale ; Ribeiro, P. ; Auriel, G. ; Azais, Bruno ; Marec, R. ; Calvel, P. ; Beze
Author_Institution :
CEA (Gramat), Gramat, France
Abstract :
The synergistic effect between Total Ionizing Dose (TID) and Analog Single Event Transient (ASET) in LM124 operational amplifiers (opamps) from three different manufacturers is investigated. This effect is clearly identified on only two manufacturers by three, highlighting manufacturer dependent. In fact, significant variations were observed on both the TID sensitivity and the ASET response of LM124 devices from different manufacturers. Hypotheses are made on the cause of the differences observed. A previously developed ASET simulation tool is used to model the transient response. The effects of TID on devices are taken into account in the model by injecting the variations of key electrical parameters obtained during Co60 irradiation. An excellent agreement is observed between the experimental responses and the model outputs, independently of the TID level, the bias configuration and the manufacturer of the device.
Keywords :
operational amplifiers; sensitivity; single electron devices; transient response; ASET response; LM124 operational amplifier; TID sensitivity; analog single event transient; bias configuration; key electrical parameters; opamps; synergistic effect; total ionizing dose; transient response; Bipolar integrated circuits; Integrated circuit modeling; Performance evaluation; Radiation effects; Single event transients; Transient response; Bipolar analog integrated circuits; circuit modeling; ionizing dose; single event transient; transient response;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2280294
