• DocumentCode
    574792
  • Title

    Asymptotic normality and uncertainty bounds for reliability estimates from subsystem and full system tests

  • Author

    Spall, James C.

  • Author_Institution
    Johns Hopkins Univ. Appl. Phys. Lab., Laurel, MD, USA
  • fYear
    2012
  • fDate
    27-29 June 2012
  • Firstpage
    56
  • Lastpage
    61
  • Abstract
    A previous paper (Spall, 2010) described a method for estimating the reliability of a complex system based on a combination of full system and subsystem tests. A maximum likelihood estimate (MLE) is formed to estimate the subsystem reliabilities and the full system reliability. While the previous paper gave conditions under which the MLE converges to the true reliability as the sample size gets large, the reference left open the question of how to formally compute uncertainty bounds (e.g., confidence bounds). A key part of computing such bounds is the determination of the large-sample (asymptotic) distribution for the estimate. In addition, the asymptotic distribution is important for determining whether the data have enough information to provide meaningful estimates of full system and subsystem reliabilities. This paper presents formal conditions for the asymptotic normality of the MLE to the true full system and subsystem reliability values. The paper also discusses a Monte Carlo-based bootstrap method for computing uncertainty bounds.
  • Keywords
    Monte Carlo methods; asymptotic stability; maximum likelihood estimation; reliability theory; Monte Carlo based bootstrap method; asymptotic distribution; asymptotic normality; complex system; full system reliability; full system test; large sample distribution; maximum likelihood estimate; reliability estimates; subsystem reliability value; uncertainty bounds; Convergence; Maximum likelihood estimation; Monte Carlo methods; Reliability theory; Uncertainty; Vectors; System identification; asymptotic distribution; bootstrap; confidence bounds; maximum likelihood; optimization; parameter estimation; system reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2012
  • Conference_Location
    Montreal, QC
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4577-1095-7
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2012.6315429
  • Filename
    6315429