Title :
Displacement Sensing by Repetition Rate Pulling in a Passively Mode Locked Laser Under Feedback
Author :
Simos, Christos ; Simos, Hercules ; Nikas, Thomas ; Syvridis, Dimitris
Author_Institution :
Dept. of Electron. Eng., Technol. Educ. Inst. of Sterea Hellas, Lamia, Greece
Abstract :
We propose and experimentally validate a simple displacement sensing technique, which relies on the optical feedback-induced pulling of the repetition rate in a passively mode-locked semiconductor laser. Depending on the setup parameters, different realizations of the technique permit displacement and vibration sensing of the reflecting object. Other physical parameters that modify the optical length of the external cavity could also be measured. The technique is particularly well adapted for fast phenomena and offers a subwavelength theoretical displacement resolution, which is limited only by the RF linewidth of the laser and resolution of the repetition frequency measurement.
Keywords :
displacement measurement; laser cavity resonators; laser feedback; laser mode locking; measurement by laser beam; semiconductor lasers; RF linewidth; external cavity; optical feedback-induced pulling; optical length; passively mode-locked semiconductor laser; physical parameters; reflecting object; repetition frequency measurement resolution; repetition rate pulling; setup parameters; simple displacement sensing technique; subwavelength theoretical displacement resolution; vibration sensing; Cavity resonators; Frequency measurement; Laser feedback; Laser mode locking; Measurement by laser beam; Optical feedback; Semiconductor lasers; Mode locked lasers; displacement measurement; optical feedback; semiconductor lasers;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2014.2354694