DocumentCode
574889
Title
Resistance evolution in HIV — Modeling when to intervene
Author
Cortes, L.M.P. ; Zurakowski, Ryan
Author_Institution
Biomed. Eng. Dept., Nat. Univ. of Columbia, Columbia, NY, USA
fYear
2012
fDate
27-29 June 2012
Firstpage
4053
Lastpage
4058
Abstract
The treatment of HIV is complicated by the evolution of antiviral drug resistant virus and the limited availability of antigenically independent antiviral regimens. The consequences to the patient of successive virological failures is such that many strategies to minimize the occurrence of such failures are being investigated. In this paper, a Markov chain-based model of virological failure is introduced. This model considers sequential failure events, and differentiates between several modes of virological failure. This model is then used to evaluate the resistance- targeted interventions by means of testing the impact of a viral load preconditioning strategy on total treatment regimen longevity in HIV patients. It is shown that a proposed intervention targeting pre-existing resistance has the potential to increase the expected time to three sequential virological failures by an average of 3.3 years per patient. When combined with an intervention targeting patient compliance, the total potential increase in the time to three sequential virological failures is as high as 11.2 years. The impact on patient and public health is discussed.
Keywords
Markov processes; diseases; drugs; evolution (biological); failure analysis; health care; microorganisms; patient treatment; HIV patient; HIV resistance evolution; HIV treatment; Markov chain-based model; antigenically independent antiviral regimen; antiviral drug resistant virus evolution; failure occurrence minimization; patient compliance; patient health; public health; resistance-targeted intervention; sequential failure events; successive virological failures; total treatment regimen longevity; viral load preconditioning strategy; Drugs; Equations; Human immunodeficiency virus; Immune system; Markov processes; Strain;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2012
Conference_Location
Montreal, QC
ISSN
0743-1619
Print_ISBN
978-1-4577-1095-7
Electronic_ISBN
0743-1619
Type
conf
DOI
10.1109/ACC.2012.6315693
Filename
6315693
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