DocumentCode :
575476
Title :
Correcting phase unwrapping errors with color phase shifting method
Author :
Iwasa, Takashi ; Ohtani, Kozo ; Baba, Mitsuru
Author_Institution :
Grad. Sch. of Sci. & Eng., Ibaraki Univ., Hitachi, Japan
fYear :
2012
fDate :
20-23 Aug. 2012
Firstpage :
1248
Lastpage :
1251
Abstract :
3-D shape measurement techniques have applications in such diverse areas as industrial inspection, reverse engineering, robotic vision, computer graphics, medical diagnosis, etc. Structured light techniques based on sinusoidal phase shifting methods are widely used for 3-D profile measurement due to their measurement speed and accuracy. However, phase-unwrapping algorithms have difficulty in correcting phase unwrapping error due to random wrong order of fringe pattern in specular object. Therefore, it is difficult for the conventional phase shift approach to apply for 3D shape measurement of specular object. In this paper, we propose a novel color phase shift approach to allow to correct phase unwrapping error for specular object.
Keywords :
error correction; shape measurement; 3D profile measurement; 3D shape measurement; color phase shifting method; fringe pattern; phase unwrapping error correction; sinusoidal phase shifting method; specular object; structured light technique; Cameras; Educational institutions; Image color analysis; Measurement uncertainty; Phase measurement; Shape measurement; Surface waves; 3D shape measurement; Color pattern; Phase shift method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SICE Annual Conference (SICE), 2012 Proceedings of
Conference_Location :
Akita
ISSN :
pending
Print_ISBN :
978-1-4673-2259-1
Type :
conf
Filename :
6318637
Link To Document :
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