• DocumentCode
    576263
  • Title

    Unexpected height offsets in TanDEM-X: Explanation and correction

  • Author

    Krieger, Gerhard ; De Zan, Francesco ; Bachmann, Markus ; Gonzalez, Jaime Hueso ; Cassola, Marc Rodriguez ; Zink, Manfred

  • Author_Institution
    Microwaves & Radar Inst., German Aerosp. Center (DLR), Oberpfaffenhofen, Germany
  • fYear
    2012
  • fDate
    22-27 July 2012
  • Firstpage
    295
  • Lastpage
    298
  • Abstract
    This paper reports on systematic height offsets that have been observed in TanDEM-X by evaluating a large number of digital elevation model (DEM) acquisitions. Besides the expected instrument and baseline offsets, which are compensated in the calibration chain, two unexpected external error sources have been identified that apply to any formation flying bistatic SAR interferometer. The first contribution is due to relativistic effects and can be well explained within Einstein´s special theory of relativity. The second effect is due to differential delays in the troposphere. It is shown that the theoretic predictions are in good agreement with the observed offsets. All necessary corrections have in the meantime been integrated in the operational TanDEM-X processing chain.
  • Keywords
    calibration; digital elevation models; radar interferometry; special relativity; synthetic aperture radar; troposphere; Einstein special relativity theory; baseline offsets; calibration chain; differential delays; digital elevation model acquisitions; external error sources; formation flying bistatic SAR interferometer; operational TanDEM-X processing chain; relativistic effects; systematic height offsets; troposphere; Calibration; Delay; Relativistic effects; Satellites; Synchronization; Synthetic aperture radar; Transmitters; Bistatic Synchronization; Interferometry; Reference Frames; Relativity; Synthetic Aperture Radar (SAR); Tropospheric Delay;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
  • Conference_Location
    Munich
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4673-1160-1
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2012.6351579
  • Filename
    6351579