DocumentCode :
576376
Title :
Optimal placement for partially populated system EMI testing
Author :
Cracraft, M. ; Connor, Samuel ; Archambeault, Bruce
Author_Institution :
IBM Syst. & Technol. Group, Poughkeepsie, NY, USA
fYear :
2012
fDate :
6-10 Aug. 2012
Firstpage :
369
Lastpage :
374
Abstract :
Electrical systems like servers, IO cages, storage appliances, and others can contain many sources of radiated emissions. During product development the demand for hardware can outpace the supply, especially when the sub-components are at the forefront of technology themselves. Necessity may require testing with less than a full configuration. If so, the available hardware should be positioned to maximize emissions rather than minimize them. It is better to overestimate when establishing margins with respect to the regulatory limits. This paper describes a method of finding optimal placements for the limited hardware using genetic algorithms, full-wave models, and far-field calculations.
Keywords :
electromagnetic interference; genetic algorithms; testing; electrical systems; far-field calculations; full-wave models; genetic algorithms; partially populated system EMI testing; radiated emission source; Apertures; Arrays; Connectors; Drives; Electromagnetic interference; Hardware; Metals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Conference_Location :
Pittsburgh, PA
ISSN :
2158-110X
Print_ISBN :
978-1-4673-2061-0
Type :
conf
DOI :
10.1109/ISEMC.2012.6351820
Filename :
6351820
Link To Document :
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