• DocumentCode
    576376
  • Title

    Optimal placement for partially populated system EMI testing

  • Author

    Cracraft, M. ; Connor, Samuel ; Archambeault, Bruce

  • Author_Institution
    IBM Syst. & Technol. Group, Poughkeepsie, NY, USA
  • fYear
    2012
  • fDate
    6-10 Aug. 2012
  • Firstpage
    369
  • Lastpage
    374
  • Abstract
    Electrical systems like servers, IO cages, storage appliances, and others can contain many sources of radiated emissions. During product development the demand for hardware can outpace the supply, especially when the sub-components are at the forefront of technology themselves. Necessity may require testing with less than a full configuration. If so, the available hardware should be positioned to maximize emissions rather than minimize them. It is better to overestimate when establishing margins with respect to the regulatory limits. This paper describes a method of finding optimal placements for the limited hardware using genetic algorithms, full-wave models, and far-field calculations.
  • Keywords
    electromagnetic interference; genetic algorithms; testing; electrical systems; far-field calculations; full-wave models; genetic algorithms; partially populated system EMI testing; radiated emission source; Apertures; Arrays; Connectors; Drives; Electromagnetic interference; Hardware; Metals;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4673-2061-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2012.6351820
  • Filename
    6351820