DocumentCode
576376
Title
Optimal placement for partially populated system EMI testing
Author
Cracraft, M. ; Connor, Samuel ; Archambeault, Bruce
Author_Institution
IBM Syst. & Technol. Group, Poughkeepsie, NY, USA
fYear
2012
fDate
6-10 Aug. 2012
Firstpage
369
Lastpage
374
Abstract
Electrical systems like servers, IO cages, storage appliances, and others can contain many sources of radiated emissions. During product development the demand for hardware can outpace the supply, especially when the sub-components are at the forefront of technology themselves. Necessity may require testing with less than a full configuration. If so, the available hardware should be positioned to maximize emissions rather than minimize them. It is better to overestimate when establishing margins with respect to the regulatory limits. This paper describes a method of finding optimal placements for the limited hardware using genetic algorithms, full-wave models, and far-field calculations.
Keywords
electromagnetic interference; genetic algorithms; testing; electrical systems; far-field calculations; full-wave models; genetic algorithms; partially populated system EMI testing; radiated emission source; Apertures; Arrays; Connectors; Drives; Electromagnetic interference; Hardware; Metals;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Conference_Location
Pittsburgh, PA
ISSN
2158-110X
Print_ISBN
978-1-4673-2061-0
Type
conf
DOI
10.1109/ISEMC.2012.6351820
Filename
6351820
Link To Document