Title :
On-die self-healing of mixer image-rejection ratio for mixed-signal electronic systems
Author :
Shankar, Subramaniam ; Saha, Prabir ; Howard, Duane C. ; Diestelhorst, Ryan ; England, Troy D. ; Cardoso, Adilson S. ; Cressler, John D.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Tech, Atlanta, GA, USA
fDate :
Sept. 30 2012-Oct. 3 2012
Abstract :
An integrated wideband (6-20 GHz) image-reject mixer and test signal source for "self-healing" of image-rejection ratio (IRR) is demonstrated for the first time. The mixer can be adapted to deliver consistent performance over process variations, environmental changes, and/or aging effects. An IRR of over 36 dB is obtained in measurement for a wide range of IF frequencies. The healing is achieved by means of an automated procedure controlled by MATLAB algorithms. The test signal source consists of an on-die wideband differential ring oscillator with an amplitude-control mechanism to provide a 20 dB range of adjustable power at the input of the mixer. The circuits were fabricated in a commercially-available 180 nm SiGe BiCMOS platform.
Keywords :
BiCMOS integrated circuits; CMOS integrated circuits; Ge-Si alloys; MMIC mixers; ageing; microfabrication; mixed analogue-digital integrated circuits; signal sources; BiCMOS platform; IF frequency measurement; IRR; MATLAB algorithm; SiGe; aging effect; amplitude-control mechanism; frequency 6 GHz to 20 GHz; gain 20 dB; integrated wideband image-reject mixer; mixed-signal electronic system; mixer image-rejection ratio; on-die self-healing process; on-die wideband differential ring oscillator; signal source testing; size 180 nm; Couplers; Linearity; Mixers; Radio frequency; Silicon germanium; Tuning; Wideband;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2012 IEEE
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4673-3020-6
DOI :
10.1109/BCTM.2012.6352658
