Title :
Results of Displacement Damage Testing of the Intersil ISL70227SRH Dual Operational Amplifier
Author :
van Vonno, N.W. ; Hood, R.A. ; Mansilla, O. ; Thomson, E.J. ; Ballou, F.C.
Author_Institution :
Intersil Corp., Melbourne, FL, USA
Abstract :
We report results of displacement damage testing of the Intersil ISL70227SRH dual operational amplifier. This part uses a complementary bipolar SOI process. Samples were irradiated using 1MeV neutrons at the WSMR Fast Burst Reactor.
Keywords :
operational amplifiers; silicon-on-insulator; testing; Intersil ISL70227SRH dual operational amplifier; WSMR fast burst reactor; complementary bipolar SOI process; displacement damage testing; Gain; Inductors; Neutrons; Operational amplifiers; Power supplies; Radiation effects; Testing;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-2730-5
DOI :
10.1109/REDW.2012.6353707
