Title :
Programmatic Impact of SDRAM SEFI
Author :
Guertin, Steven M. ; Allen, Gregory R. ; Sheldon, Douglas J.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
The Elpida EDS5104(08)ABTA 512Mb SDRAM is examined for programmatic impact of SEE. Use cases for the devices including EDAC and mode register reload are examined. Results indicate some SEE mitigation methods require careful application to achieve system-level benefits, while some event types are essentially mitigated by the application use. In the studied devices, MBE and SEFI are identified and investigated as mechanisms requiring special consideration.
Keywords :
SRAM chips; error correction; error detection; Elpida EDS5104(08)ABTA SDRAM; SDRAM SEFI; error detection and correction; memory size 512 MByte; mode register reload; programmatic impact; single event effect mitigation method; single event functionality interrupt; Laboratories; Performance evaluation; Propulsion; Registers; SDRAM; Space vehicles; Standards;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-2730-5
DOI :
10.1109/REDW.2012.6353722
