• DocumentCode
    576745
  • Title

    Programmatic Impact of SDRAM SEFI

  • Author

    Guertin, Steven M. ; Allen, Gregory R. ; Sheldon, Douglas J.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The Elpida EDS5104(08)ABTA 512Mb SDRAM is examined for programmatic impact of SEE. Use cases for the devices including EDAC and mode register reload are examined. Results indicate some SEE mitigation methods require careful application to achieve system-level benefits, while some event types are essentially mitigated by the application use. In the studied devices, MBE and SEFI are identified and investigated as mechanisms requiring special consideration.
  • Keywords
    SRAM chips; error correction; error detection; Elpida EDS5104(08)ABTA SDRAM; SDRAM SEFI; error detection and correction; memory size 512 MByte; mode register reload; programmatic impact; single event effect mitigation method; single event functionality interrupt; Laboratories; Performance evaluation; Propulsion; Registers; SDRAM; Space vehicles; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2012 IEEE
  • Conference_Location
    Tucson, AZ
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4673-2730-5
  • Type

    conf

  • DOI
    10.1109/REDW.2012.6353722
  • Filename
    6353722
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=576745