• DocumentCode
    576749
  • Title

    Recent Power MOSFET Single Event Testing Results

  • Author

    Scheick, Leif Z.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    The results of recent Single Event Effect (SEE) testing of newly available power MOSFETS are presented.
  • Keywords
    power MOSFET; radiation hardening (electronics); semiconductor device testing; SEE testing; power MOSFET single event testing; Bars; Logic gates; Power MOSFET; Standards; Testing; Xenon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2012 IEEE
  • Conference_Location
    Tucson, AZ
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4673-2730-5
  • Type

    conf

  • DOI
    10.1109/REDW.2012.6353735
  • Filename
    6353735
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=576749