DocumentCode :
576806
Title :
Cooperative Built-in Self-Testing and Self-Diagnosis of NoC Bisynchronous Channels
Author :
Caselli, Nicola ; Strano, Alessandro ; Ludovici, Daniele ; Bertozzi, Davide
Author_Institution :
ENDIF, Univ. of Ferrara, Ferrara, Italy
fYear :
2012
fDate :
20-22 Sept. 2012
Firstpage :
159
Lastpage :
166
Abstract :
This paper proposes a built-in self-test/self-diagnosis procedure at start-up of an on-chip network (NoC) for bisynchronous communication channels. Concurrent BIST operations are carried out after reset at each switch, thus resulting in scalable test application time with network size. The key principle consists of exploiting the inherent structural redundancy of the NoC architecture in a cooperative way for the effective diagnosis and error detection. At-speed testing of stuck-at faults can be performed in less than 4000 cycles regardless of their size, with an hardware overhead of less than 30%.
Keywords :
built-in self test; fault diagnosis; integrated circuit testing; network-on-chip; BIST operations; NoC bisynchronous channels; bisynchronous communication channels; cooperative built-in self-testing; error detection; inherent structural redundancy; on-chip network; self-diagnosis procedure; stuck-at faults; test application time; Built-in self-test; Circuit faults; Receivers; Switches; Synchronization; BIST; Bisynchronous; Networks-on-Chip; Pseudo-Random Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Embedded Multicore Socs (MCSoC), 2012 IEEE 6th International Symposium on
Conference_Location :
Aizu-Wakamatsu
Print_ISBN :
978-1-4673-2535-6
Electronic_ISBN :
978-0-7695-4800-5
Type :
conf
DOI :
10.1109/MCSoC.2012.13
Filename :
6354694
Link To Document :
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