• DocumentCode
    577262
  • Title

    Throughput performance of V-BLAST-enabled wireless ad hoc networks

  • Author

    Firyaguna, Fadhil ; Christófaro, Ana C O ; Andrade, Everton A L ; Bonfim, Tiago S. ; Carvalho, Marcelo M.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Brasilia, Brasilia, Brazil
  • fYear
    2012
  • fDate
    15-17 Aug. 2012
  • Firstpage
    688
  • Lastpage
    693
  • Abstract
    This paper studies the throughput performance of wireless ad hoc networks when nodes are equipped with the Vertical Bell Labs Layered Space-Time (V-BLAST) system. To accomplish this task, we present an implementation of V-BLAST in the ns-3 network simulator that is based on the original work of Loyka and Gagnon, who have developed analytical expressions for the average bit error rate of V-BLAST. Such an implementation consists of simple modifications to the IEEE 802.11b that include not only aspects related to SINR and BER computation, but also how clear channel assessment is performed and how the four-way handshake mechanism is set for V-BLAST transmissions. We investigate the average network throughput for random topologies not fully connected under different antenna configurations. Simulation results show that, depending on the antenna configuration, significant quasi-linear network throughput gains can be achieved, especially if the diversity gains of V-BLAST are also exploited.
  • Keywords
    ad hoc networks; diversity reception; error statistics; radio networks; telecommunication channels; BER; IEEE 802.11b; SINR; V-BLAST-enabled wireless ad hoc networks; Vertical Bell Labs Layered Space-Time system; analytical expressions; antenna configurations; bit error rate; channel assessment; diversity gains; four-way handshake mechanism; network simulator; quasi-linear network; Bit error rate; Interference; MIMO; Receiving antennas; Signal to noise ratio; Throughput; Transmitting antennas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications in China (ICCC), 2012 1st IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4673-2814-2
  • Electronic_ISBN
    978-1-4673-2813-5
  • Type

    conf

  • DOI
    10.1109/ICCChina.2012.6356971
  • Filename
    6356971