DocumentCode
57773
Title
Blind Calibration Algorithm for Nonlinearity Correction Based on Selective Sampling
Author
Gande, Manideep ; Venkatram, H. ; Lee Ho-Young ; Guerber, Jon ; Moon, Un-Ku
Author_Institution
EECS, Oregon State Univ., Corvallis, OR, USA
Volume
49
Issue
8
fYear
2014
fDate
Aug. 2014
Firstpage
1715
Lastpage
1724
Abstract
This paper proposes a blind calibration algorithm for suppressing nonlinearity in analog-to-digital converters (ADCs). The proposed algorithm does not need any external calibration signal and is first of its kind. The proposed algorithm relies on the properties of downsampling and orthogonality of sinusoidal signals to estimate the nonlinearity coefficients present in the system and can be operated to remove even and odd order nonlinearities simultaneously. The working of the algorithm is demonstrated on a first-order ring oscillator based ΔΣ ADC, whose performance is limited due to the nonlinearity present in its system. Built in 0.13 μm CMOS, the algorithm improves the SNDR of the ADC by 39 dB, while improving SFDR by 45 dB.
Keywords
analogue-digital conversion; calibration; signal sampling; CMOS; analog to digital converters; blind calibration algorithm; first order ring oscillator; nonlinearity coefficients; nonlinearity correction; selective sampling; size 0.13 mum; Algorithm design and analysis; Calibration; Educational institutions; Engines; Equations; Frequency-domain analysis; Least squares approximations; ADC; CMOS; VCO; calibration; downsampling; nonlinearity; orthogonal signals;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2014.2321163
Filename
6837530
Link To Document