DocumentCode :
577883
Title :
InGaAs/InP single photon avalanche diodes with negative feedback
Author :
Jiang, Xudong ; Itzler, Mark A. ; Donnell, Kevin O. ; Entwistle, Mark ; Slomkowski, Krystyna
Author_Institution :
Princeton Lightwave, Inc., Cranbury, NJ, USA
fYear :
2012
fDate :
23-27 Sept. 2012
Firstpage :
92
Lastpage :
93
Abstract :
We have designed and fabricated various NFAD devices, and they show reasonable dark count rate and afterpulse probability at 10% PDE. These NFAD devices have great promise to reduce charge flow compared to passively quenched SPADs with hybridly integrated resistance and purely active quenched SPADs, and therefore significantly reduce afterpulse effects. Operating the NFAD is very simple compared to actively quenched free-running SPAD devices. The NFAD matrix devices have the potential of resolving photon numbers. These characteristics of NFAD devices make them attractive for many applications that require single photon sensitivity with free-running operation at SWIR wavelengths.
Keywords :
III-V semiconductors; avalanche photodiodes; feedback; gallium compounds; indium compounds; infrared detectors; photon counting; InGaAs-InP; NFAD matrix devices; SWIR wavelength; actively quenched free running SPAD devices; afterpulse probability; charge flow; dark count rate; negative feedback; photon numbers; single photon avalanche diodes; single photon sensitivity; Indium gallium arsenide; Indium phosphide; Negative feedback; Photonics; Resistance; Resistors; Solids;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics Conference (IPC), 2012 IEEE
Conference_Location :
Burlingame, CA
Print_ISBN :
978-1-4577-0731-5
Type :
conf
DOI :
10.1109/IPCon.2012.6358504
Filename :
6358504
Link To Document :
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