DocumentCode
578005
Title
Novel tomography of simultaneous imaging and material characterization by spatially-resolved spectroscopy
Author
Sakatsume, Masaya ; Mikawa, Yukihiro ; Banh, Tuan Quoc ; Shioda, Tatsutoshi
Author_Institution
Dept. of Electr. Eng., Nagaoka Univ. of Technol., Nagaoka, Japan
fYear
2012
fDate
23-27 Sept. 2012
Firstpage
593
Lastpage
594
Abstract
Novel tomography was developed to observe both tomographic imaging and tomographic spectroscopic simultaneously. This method can obtain the electric field spectra of each slice in sample with optical parameters, as complex refractive index, refractivity, transmittance,.
Keywords
image processing; optical tomography; refractive index; terahertz spectroscopy; complex refractive index; electric field spectra; material characterization; optical parameters; refractivity; spatially-resolved spectroscopy; tomographic imaging; tomographic spectroscopy; Calibration; Mirrors; Optical imaging; Optical interferometry; Optical refraction; Optical variables control; Tomography; Spectroscopy; Tomography; time-domain interferometry; tomographic spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Photonics Conference (IPC), 2012 IEEE
Conference_Location
Burlingame, CA
Print_ISBN
978-1-4577-0731-5
Type
conf
DOI
10.1109/IPCon.2012.6358760
Filename
6358760
Link To Document