• DocumentCode
    57858
  • Title

    Trigger and Self-Latch Mechanisms of n-p-n Bistable Resistor

  • Author

    Jin-Woo Han ; Meyyappan, M.

  • Author_Institution
    Center for Nanotechnol., NASA Ames Res. Center, Moffett Field, CA, USA
  • Volume
    35
  • Issue
    3
  • fYear
    2014
  • fDate
    Mar-14
  • Firstpage
    387
  • Lastpage
    389
  • Abstract
    Trigger and self-latch mechanisms in n-p-n bistable resistor (biristor) were investigated. A two terminal vertical n-p-n biristor with floating p-type base was fabricated on a bulk silicon wafer. The temperature and current compliance effects on the current-voltage characteristics were analyzed to understand the underlying physical mechanism. The fact that the current compliance is temperature independent suggests that latch-up is triggered by band-to-band tunneling. In contrast, the high temperature and current compliance diminished the latch-down and hysteresis loop, which reveals that impact ionization is responsible for self-latching at bistable regime.
  • Keywords
    flip-flops; impact ionisation; p-n junctions; resistors; tunnelling; band-to-band tunneling; bulk silicon wafer; current compliance effects; current-voltage characteristics; floating p-type base; hysteresis loop; impact ionization; latch-down; latch-up; n-p-n bistable resistor; self-latch mechanisms; trigger; two terminal vertical n-p-n biristor; underlying physical mechanism; Current measurement; Hysteresis; Resistors; Silicon; Temperature; Temperature measurement; Tunneling; Self latch; biristor; bistable resistor; floating base; n-p-n device;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2013.2297277
  • Filename
    6710153