DocumentCode :
57858
Title :
Trigger and Self-Latch Mechanisms of n-p-n Bistable Resistor
Author :
Jin-Woo Han ; Meyyappan, M.
Author_Institution :
Center for Nanotechnol., NASA Ames Res. Center, Moffett Field, CA, USA
Volume :
35
Issue :
3
fYear :
2014
fDate :
Mar-14
Firstpage :
387
Lastpage :
389
Abstract :
Trigger and self-latch mechanisms in n-p-n bistable resistor (biristor) were investigated. A two terminal vertical n-p-n biristor with floating p-type base was fabricated on a bulk silicon wafer. The temperature and current compliance effects on the current-voltage characteristics were analyzed to understand the underlying physical mechanism. The fact that the current compliance is temperature independent suggests that latch-up is triggered by band-to-band tunneling. In contrast, the high temperature and current compliance diminished the latch-down and hysteresis loop, which reveals that impact ionization is responsible for self-latching at bistable regime.
Keywords :
flip-flops; impact ionisation; p-n junctions; resistors; tunnelling; band-to-band tunneling; bulk silicon wafer; current compliance effects; current-voltage characteristics; floating p-type base; hysteresis loop; impact ionization; latch-down; latch-up; n-p-n bistable resistor; self-latch mechanisms; trigger; two terminal vertical n-p-n biristor; underlying physical mechanism; Current measurement; Hysteresis; Resistors; Silicon; Temperature; Temperature measurement; Tunneling; Self latch; biristor; bistable resistor; floating base; n-p-n device;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2013.2297277
Filename :
6710153
Link To Document :
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