Title :
Joint estimation of time of arrival and channel power delay profile for pulse-based UWB systems
Author :
Shang, Fang ; Champagne, Benoit ; Psaromiligkos, Ioannis
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
Abstract :
Sub-Nyquist maximum likelihood (ML)-based time of arrival (TOA) estimation methods for ultra-wideband (UWB) signals normally assume a priori knowledge of the UWB channel in the form of the average power delay profile (APDP). In practice however, and despite its importance, the APDP is not always available. To address this issue, we develop in this paper a joint estimator of TOA and APDP. Knowing that the APDP of a UWB channel usually consists of several clusters, each with specific exponential decay rate, a parametric APDP model of this type is employed. The parameters of this model are estimated via a least-squares fitting approach; then the estimated APDP is used to form a likelihood function and obtain a ML estimator of the TOA. Simulations show that the TOA estimated jointly in this way achieves a good accuracy in practical scenarios. The proposed APDP estimate can also help to boost the performance of previously reported TOA estimators that assume a priori APDP knowledge, although the proposed ML scheme generally offers superior performance.
Keywords :
least squares approximations; maximum likelihood estimation; time-of-arrival estimation; ultra wideband communication; UWB channel; average power delay profile; channel power delay profile; exponential decay rate; least-squares fitting; parametric APDP model; pulse-based UWB systems; sub-Nyquist maximum likelihood estimation; time of arrival estimation; ultra-wideband signals; Delay; Joints; Maximum likelihood estimation; Time of arrival estimation; Ultra wideband technology; Vectors; average power delay profile (APDP); maximum likelihood (ML); time of arrival (TOA) estimation; ultra wideband (UWB);
Conference_Titel :
Communications (ICC), 2012 IEEE International Conference on
Conference_Location :
Ottawa, ON
Print_ISBN :
978-1-4577-2052-9
Electronic_ISBN :
1550-3607
DOI :
10.1109/ICC.2012.6364633