A Novel Error-Detection Mechanism for Digital Circuits Using Markov Random Field Modelling

Author

Anwer, Jahanzeb ; Khalid, Usman ; Singh, Navab ; Hamid, Nor Hisham ; Asirvadam, Vijanth S.

Author_Institution

Electr. & Electron. Eng. Dept., Univ. Teknol. PETRONAS, Tronoh, Malaysia

fYear

2012

fDate

3-5 Nov. 2012

Firstpage

883

Lastpage

886

Abstract

The error-sensitivity of nanoscale circuits is an extremely important issue in electronic industry these days. The reason is the high susceptibility of electronic circuits to noise at the nanoscale level. Markov Random Field (MRF) modelling is one approach to achieve noise-tolerance in integrated circuit design. In this paper, we have designed an error-detection mechanism for digital circuits based on Joint Probability analysis of Markov random Field (MRF) networks. The circuit and test bench design has been carried out in the software Xilinx ISE 8.1i. Our error-detection mechanism is an excellent solution for digital system designs where space is not a critical factor but reliability of system matters a lot.

Keywords

Markov processes; digital circuits; error detection; probability; reliability; Markov random field modelling; Markov random field network; digital circuit; digital system design; error-detection mechanism; joint probability analysis; novel error detection mechanism; software Xilinx ISE 8.1i; system reliability; testbench design; Integrated circuit modeling; Joints; Logic gates; Markov random fields; Nanoscale devices; Noise; Reliability; Markov random field; errordetection module; joint probability;

fLanguage

English

Publisher

ieee

Conference_Titel

Computational Intelligence and Communication Networks (CICN), 2012 Fourth International Conference on

Conference_Location

Mathura

Print_ISBN

978-1-4673-2981-1

Type

conf

DOI

10.1109/CICN.2012.30

Filename

6375241