Title :
Flexible cache error protection using an ECC FIFO
Author :
Doe Hyun Yoon ; Erez, M.
Author_Institution :
Univ. of Texas at Austin, Austin, TX, USA
Abstract :
We present ECC FIFO, a mechanism enabling two-tiered last-level cache error protection using an arbitrarily strong tier-2 code without increasing on-chip storage. Instead of adding redundant ECC information to each cache line, our ECC FIFO mechanism off-loads the extra information to off-chip DRAM. We augment each cache line with a tier-1 code, which provides error detection consuming limited resources. The redundancy required for strong protection is provided by a tier-2 code placed in off-chip memory. Because errors that require tier-2 correction are rare, the overhead of accessing DRAM is unimportant. We show how this method can save 15-25% and 10-17% of on-chip cache area and power respectively while minimally impacting performance, which decreases by 1% on average across a range of scientific and consumer benchmarks.
Keywords :
DRAM chips; cache storage; error correction; error detection; ECC FIFO; ECC information; cache line; error detection; flexible cache error protection; off-chip DRAM; off-chip memory; on-chip cache area; on-chip storage; strong tier-2 code; tier-1 code; tier-2 correction; two-tiered last-level cache error protection; error correction; last-level caches; reliability; soft error;
Conference_Titel :
High Performance Computing Networking, Storage and Analysis, Proceedings of the Conference on
Conference_Location :
Portland, OR
DOI :
10.1145/1654059.1654109