Title :
Statistical timing characterization
Author :
Wu, Z. ; Maurine, P. ; Azemard, N. ; Ducharme, G.
Author_Institution :
LIRMM, Univ. of Montpellier II, Montpellier, France
Abstract :
Monte Carlo (MC) method is the standard method to characterize statistical moments of cell delays and slopes. However, this method suffers from very high computational cost. In this paper, we propose a technique to quickly and accurately estimate Standard Deviation (SD) of standard cell delays and slopes. The proposed technique is based on the identification, performed with a reduced set of MC simulations, of delay and output slope SD functions that take input slope, output load and supply voltage as input arguments. These identified functions are then used to estimate SDs of delays and slopes at different operating conditions (input slope, output load, supply voltage). This proposed method provides at least 76% of CPU gains, with respect to MC, while keeping high accuracy.
Keywords :
Monte Carlo methods; timing circuits; CPU gains; Monte Carlo method; computational cost; input slope; output load; output slope; standard cell delays; standard deviation; statistical moment; statistical timing characterization; supply voltage; Delay; Handheld computers; Manufacturing; Standards; Tin; Monte Carlo method; Probability Density Functions; Statistical Static Timing Analysis;
Conference_Titel :
System on Chip (SoC), 2012 International Symposium on
Conference_Location :
Tampere
Print_ISBN :
978-1-4673-2895-1
Electronic_ISBN :
978-1-4673-2894-4
DOI :
10.1109/ISSoC.2012.6376360