Title :
Utilizing random noise in cryptography: Where is the Tofu?
Author :
Geng, Hui ; Wu, Jun ; Liu, Jianming ; Choi, Minsu ; Shi, Yiyu
Author_Institution :
ECE Dept., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
With the massive deployment of mobile devices and sensor networks, resistance against side-channel attacks in cryptographic systems has become an active research topic in recent years. While various security measures exist in literature, most of them are deterministic in nature, where the same input plaintext always results in the same power trace with a given key. Thus, attackers can still aggregate the small deviations between the power traces to identify the correct key. Towards this, random dynamic voltage scaling has been proposed in the literature, which is demonstrated to be effective against Differential Power Analysis (DPA). In this paper, we evaluate this approach, along with the expanded feature of spatial randomness, to resist Correlation Power Analysis (CPA).
Keywords :
correlation methods; cryptography; mobile radio; random noise; Tofu; correlation power analysis; cryptography; differential power analysis; input plaintext; massive deployment; mobile devices; random dynamic voltage scaling; random noise; sensor networks; side-channel attacks; spatial randomness; Correlation; Elliptic curve cryptography; Resistance; Voltage control; Correlation Power Analysis; Random Dynamic Voltage Scaling; S-Box;
Conference_Titel :
Computer-Aided Design (ICCAD), 2012 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA