DocumentCode :
581335
Title :
Removing outliers of large scale scene models based on automatic context analysis and convex optimization
Author :
Le, My-Ha ; Vavilin, Andrey ; Jo, Kang-Hyun
Author_Institution :
Sch. of Electr. Eng., Univ. of Ulsan, Ulsan, South Korea
fYear :
2012
fDate :
25-28 Oct. 2012
Firstpage :
4236
Lastpage :
4241
Abstract :
This paper proposes a method for removing outliers of large scale scene model. First, the context of the scene images are analyzed. Some objects which may have negative effect should be removed. For instance, the sky often appear as background and moving object appear in most of scene images. They are also one of reasons that cause the outliers. Second, the constraints of image pair-wise are computed based on invariant features. The correspondence problem is solved by iterative method which remove the outliers. To avoid the disadvantage of incremental structure from motion, the global rotation of cameras are estimated by a robust method. These global rotations are fed to the point clouds generation procedure in third step. In contrast with using only canonical bundle adjustment which gain unstable structure in small baseline geometry and local minima, the proposed method utilized known-rotation framework combined bundle adjustment to generate accurate point clouds and camera positions with single global minimum. The patch based multi-view stereopsis is applied to dense point cloud upgrading. The simulation results will demonstrate the accuracy of this method from large scale scene images in outdoor environment.
Keywords :
convex programming; geometry; image reconstruction; iterative methods; 3D reconstruction; automatic context analysis; bundle adjustment; canonical bundle adjustment; convex optimization; dense point cloud upgrading; image pair-wise; incremental structure; invariant features; iterative method; large scale scene models; local minima; patch based multiview stereopsis; point clouds generation procedure; robust method; scene images; single global minimum; small baseline geometry; Analytical models; Image segmentation; Minimization; Optical filters; Optical imaging; Optimization; Context analysis; PMVS; RANSAC; SIFT; convex optimization; correspondence; global rotation estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society
Conference_Location :
Montreal, QC
ISSN :
1553-572X
Print_ISBN :
978-1-4673-2419-9
Electronic_ISBN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2012.6389209
Filename :
6389209
Link To Document :
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