Title :
Data-driven quality related prediction and monitoring
Author :
Yin, Shen ; Wei, Zuolong ; Gao, Huijun ; Peng, Kaixiang
Author_Institution :
Inst. of Intell. Control & Syst., Harbin Inst. of Technol., Harbin, China
Abstract :
The quality or key performance indicator related prediction and diagnosis cover a wide range of practical requirements from industrial applications. Although much effort has been devoted to establishing an analytical model between operating conditions and quality variables based on the first principals, it is still a challenge in practice due to the complexity of large-scale industrial process. To solve this problem, the data-driven quality related prediction and monitoring schemes are proposed in this paper. In order to overcome the drawbacks of standard approach, our focus is firstly concentrated on the modifications of standard partial least squares. Moreover, under industrial operating conditions, a subspace aided data-driven approach is further utilized to construct a soft sensor in the framework of diagnostic observer based residual generator. The proposed approaches are finally applied to quality based prediction and diagnosis on an industrial hot strip mill process. Application results indicate the effectiveness of the proposed methods and demonstrate improvement in performance compared to the standard technique.
Keywords :
data handling; fault diagnosis; hot rolling; milling; principal component analysis; product quality; data-driven quality related monitoring scheme; data-driven quality related prediction scheme; diagnostic observer based residual generator; fault diagnosis; fault prediction; industrial applications; industrial hot strip mill process; industrial operating conditions; key performance indicator related diagnosis; key performance indicator related prediction; large-scale industrial process; principle component analysis; quality variables; soft sensor; standard partial least squares; Discrete wavelet transforms; Fault diagnosis; Matrix decomposition; Measurement units; Monitoring; Data-driven methods; fault diagnosis and prediction; modified partial least squares; quality or key performance indicator related; subspace aided approach;
Conference_Titel :
IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-2419-9
Electronic_ISBN :
1553-572X
DOI :
10.1109/IECON.2012.6389273