Automated nanomanipulation with AFM by using L1 adaptive controller

In this paper, a novel control methodology for automatically manipulating nano particles by using Atomic Force Microscope (AFM) is presented. First of all, a mathematical model of nanomanipulation including the interactive forces and dynamics between the tip, particle and substrate along with the roughness effect of the substrate is introduced. Further, in order to deal with the nonlinear uncertain system, a stable virtual reference counterpart is constructed. Thereafter, a piece-wise continuous adaptive law is introduced along with a low-pass filter to obtain arbitrarily close tracking of the output, while the bounded transient performance of the input signal is also guaranteed. Rigid mathematical proof is substantiated by simulation results.