Raman spectroscopic image analysis on micropatterned graphene

Author

Wooseok Choi ; Joonkyu Park ; Jongwan Jung ; Yongho Seo ; Jinho Ahn ; In-Sung Park

Author_Institution

Fac. of Nanotechnol. & Adv. Mater. Eng., Sejong Univ., Seoul, South Korea

Volume

8

Issue

7

fYear

2013

fDate

Jul-13

Firstpage

362

Lastpage

365

Abstract

A study has been conducted on patterned graphene with widths in the range of 0.1-4 μm which was grown by chemical vapour deposition and patterned by electron beam lithography. The microscopic behaviour of the Raman spectrum was investigated using image mapping from Raman spectroscopic data. Among three main peaks (D-band, G-band and 2D-band), the two-dimensional (2D) peak was clear even in 200 nm width graphene, however the D-band signal was very weak, confirming low defect concentration. It was found that the 2D-band line width was decreased as the width became narrower, which was explained by refining the electronic band structure because of confined sample size. The 2D- and G-band intensities were decreased by reducing the width because the laser beam spot size was greater than the width of the sample and the effective area generating the signal was reduced.

Keywords

Raman spectra; band structure; chemical vapour deposition; electron beam lithography; graphene; spectral line breadth; spectral line intensity; 2D peak; 2D-band intensity; 2D-band line width; C; D-band signal; G-band intensity; Raman spectroscopic image analysis; Raman spectrum; chemical vapour deposition; confined size; defect concentration; effective area generating signal; electron beam lithography; electronic band structure; image mapping; laser beam spot size; micropatterned graphene; microscopic behaviour; size 0.1 mum to 4 mum;

fLanguage

English

Journal_Title

Micro & Nano Letters, IET

Publisher

iet

ISSN

1750-0443

Type

jour

DOI

10.1049/mnl.2013.0160

Filename

6568529