DocumentCode :
58280
Title :
RWCap: A Floating Random Walk Solver for 3-D Capacitance Extraction of Very-Large-Scale Integration Interconnects
Author :
Wenjian Yu ; Hao Zhuang ; Chao Zhang ; Gang Hu ; Zhi Liu
Author_Institution :
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Volume :
32
Issue :
3
fYear :
2013
fDate :
Mar-13
Firstpage :
353
Lastpage :
366
Abstract :
A floating random walk (FRW) solver, called RWCap, is presented for the capacitance extraction of very-large-scale integration (VLSI) interconnects. An approach, including the numerical characterization of the cross-interface transition probability and weight value, is proposed to accelerate the extraction of structures with multiple dielectric layers. A comprehensive variance reduction scheme based on the importance sampling and stratified sampling is proposed to improve the convergence rate of the FRW algorithm. Finally, the space management technique using an octree data structure and the parallel computing technique are presented to further improve the efficiency. Numerical experiments are carried out with the test cases generated under the 180 and 45-nm process technologies. They demonstrate that the proposed multidielectric FRW algorithm achieves up to 160× speedup over the FRW algorithm using spherical transition domains to cross dielectric interface, with very small memory overhead. The variance reduction techniques further bring 3× or more speedup without memory overhead and the loss of accuracy. The RWCap also outperforms other existing FRW algorithm and fast boundary element method solvers in terms of computational time or scalability. The experiments on an 8-core CPU machine show that the parallel RWCap is over 6× faster than its serial-computing version.
Keywords :
VLSI; boundary-elements methods; computational complexity; importance sampling; integrated circuit interconnections; probability; 3D capacitance extraction; FRW solver; RWCap; VLSI interconnects; boundary element method; comprehensive variance reduction; computational time; cross dielectric interface; cross-interface transition probability; floating random walk solver; importance sampling; parallel computing technique; space management technique; very-large-scale integration interconnects; Algorithm design and analysis; Capacitance; Conductors; Dielectrics; Frequency division multiplexing; Green´s function methods; Very large scale integration; Capacitance extraction; floating random walk (FRW); interconnect modeling; multidielectric structure; parallel computing; variance reduction;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2012.2224346
Filename :
6461990
Link To Document :
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