• DocumentCode
    583182
  • Title

    Test effectiveness index: Integrating product metrics with process metrics

  • Author

    Zhang, Yan ; Zhao, Xuying ; Zhang, Xiaokun ; Zhang, Tian

  • fYear
    2012
  • fDate
    27-31 May 2012
  • Firstpage
    54
  • Lastpage
    57
  • Abstract
    Defect measurement is an important method in the improvement of software quality. Recent approaches of defect measurement are inappropriate to small software organizations by reason of their intricacy. This paper gives a simple approach of defect measurement, which integrates the power of product metrics with process metrics, i.e., it can not only detect the defect-prone modules, but also find the problems in the software process. This approach uses the results of successive two rounds of testing to create the test effectiveness index constructively. A case study is conducted and the results indicate that the defect-prone modules can be identified and problems of testing process can be discovered by test effectiveness index.
  • Keywords
    program testing; software metrics; software quality; defect measurement; defect-prone modules; process metrics; product metrics integration; software organizations; software process; software quality; test effectiveness index; Indexes; Organizations; Software; Software engineering; Software measurement; Testing; defect measurement; process metric; small organization; test effectiveness index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cyber Technology in Automation, Control, and Intelligent Systems (CYBER), 2012 IEEE International Conference on
  • Conference_Location
    Bangkok
  • Print_ISBN
    978-1-4673-1420-6
  • Type

    conf

  • DOI
    10.1109/CYBER.2012.6392526
  • Filename
    6392526