DocumentCode
583182
Title
Test effectiveness index: Integrating product metrics with process metrics
Author
Zhang, Yan ; Zhao, Xuying ; Zhang, Xiaokun ; Zhang, Tian
fYear
2012
fDate
27-31 May 2012
Firstpage
54
Lastpage
57
Abstract
Defect measurement is an important method in the improvement of software quality. Recent approaches of defect measurement are inappropriate to small software organizations by reason of their intricacy. This paper gives a simple approach of defect measurement, which integrates the power of product metrics with process metrics, i.e., it can not only detect the defect-prone modules, but also find the problems in the software process. This approach uses the results of successive two rounds of testing to create the test effectiveness index constructively. A case study is conducted and the results indicate that the defect-prone modules can be identified and problems of testing process can be discovered by test effectiveness index.
Keywords
program testing; software metrics; software quality; defect measurement; defect-prone modules; process metrics; product metrics integration; software organizations; software process; software quality; test effectiveness index; Indexes; Organizations; Software; Software engineering; Software measurement; Testing; defect measurement; process metric; small organization; test effectiveness index;
fLanguage
English
Publisher
ieee
Conference_Titel
Cyber Technology in Automation, Control, and Intelligent Systems (CYBER), 2012 IEEE International Conference on
Conference_Location
Bangkok
Print_ISBN
978-1-4673-1420-6
Type
conf
DOI
10.1109/CYBER.2012.6392526
Filename
6392526
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